scanning probe microscopy中文是什么意思

發(fā)音:

中文翻譯
造句

描探微
掃描探針顯微鏡
掃描探針顯微術(shù)

scanning n. 1.細(xì)看，細(xì)察，審視。 2.【電視】掃描，掃掠,搜 ...
probe n. 1.【醫(yī)學(xué)】探針；探示器；取樣器；【物理學(xué)】試探電 ...
microscopy n. 顯微鏡學(xué)；顯微鏡使用術(shù)。
scanning probe microscopy(spm) 掃描顯微探針
scanning microscopy 掃描顯微術(shù)
electron-probe microscopy 電子探針顯微鏡術(shù)
confocal laser scanning microscopy 共聚焦顯微鏡; 共軛焦顯微鏡
electron scanning microscopy 掃描電子顯微術(shù)
laser scanning confocal microscopy 激光共焦點(diǎn)掃描顯微鏡
scanning electron microscopy 電子掃描顯微術(shù); 掃描電鏡檢查; 掃描電子顯微鏡檢查法; 掃描電子顯微鏡檢術(shù); 掃描電子顯微鏡術(shù); 掃描電子顯微術(shù)
scanning electron microscopy study 掃描電子顯微鏡研究
scanning electronic microscopy 【物理學(xué)】掃描電子顯微術(shù)。
scanning immuno-electron microscopy 掃描免疫電子顯微鏡檢查
scanning lorentz microscopy 洛倫茲掃描顯微術(shù)
scanning photo-acoustic microscopy 光掃描-聲學(xué)顯微鏡
scanning tunnel microscopy 掃描隧道顯微術(shù)
scanning tunneling microscopy 掃描隧道型顯微鏡學(xué)
scanning-electron microscopy 掃描電子顯微術(shù)
clsm confocal laser scanning microscopy 共焦激光掃描顯微鏡的縮寫
scanning field probe method 掃描場(chǎng)探針法
scanning probe micro scope 低真空走查電子顯微鏡
probe n. 1.【醫(yī)學(xué)】探針；探示器；取樣器；【物理學(xué)】試探電極。 2.【醫(yī)學(xué)】(對(duì)傷處等的)針探，探查；刺探；探索；試探；查究 (into); 〔美國(guó)〕調(diào)查；試樣。 3.【航空】(飛機(jī))空中加油管。 4.【宇宙空間技術(shù)】探測(cè)器；探測(cè)飛船。 a lunar probe 月球探測(cè)器。 vt. 1.用探針[探測(cè)器]探查。 2.刺探；調(diào)查，探查，查究。 probe a matter to the bottom 徹底調(diào)查一件事。 vi. (用探針)探查；探索；查究，深查 (into)。 probe deeply into 深入調(diào)查。
scanning n. 1.細(xì)看，細(xì)察，審視。 2.【電視】掃描，掃掠,搜索。
acoustic microscopy 聲納顯微術(shù); 聲顯微術(shù)
anatomical microscopy 解剖顯微鏡

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例句與用法

The applications of scanning probe microscopy a review
掃描探針顯微術(shù)的應(yīng)用綜述
Scanning probe microscopy based nanotechnology
基于掃描探針顯微鏡的納米技術(shù)
Scanning probe microscopy of combined snom sfm cantilever probe
結(jié)合的掃描探測(cè)顯微鏡
Scanning probe microscopy ( spm ) related surface science and nanotechnology
與掃描探針有關(guān)的表面科學(xué)和納米技術(shù)
Scanning probe microscopy fg 8ou
掃描探針顯微鏡
Scanning probe microscopy , spm
掃描探針顯微鏡
Scanning probe microscopy
掃描探針顯微鏡
Standard practice for measuring and reporting probe tip shape in scanning probe microscopy
掃描探測(cè)顯微鏡探頭測(cè)量和報(bào)告的標(biāo)準(zhǔn)實(shí)施規(guī)程
Scanning probe microscopy ( spm ) has evolved into a powerful tool for imaging with nanometer - scale resolution and analyzing a variety of surface in the past two decades , which is advantageous to be done in vacuum , in atmosphere , or in liquid
掃描探針顯微鏡( spm )是近二十年來(lái)發(fā)展起來(lái)的一個(gè)強(qiáng)有力的表面分析工具，具有納米級(jí)的分辨率、制樣簡(jiǎn)單、可在不同的環(huán)境下(真空、大氣、液體)進(jìn)行觀察等優(yōu)點(diǎn)。
The branches of nano - technology include nano - physics , nano - chemistry , nano - electronics , nano - material science , nano - biology , nano - mechanics and narto - measurements , etc . with the development of nano - technology , scanning probe microscopy ( spm ) , especially atomic force microscopy ( afm ) , has been the most widely demanded and applied tools for researchers to pursue more ambitious goals , and has actually become the indispensable instruments for nano - scientists and engineers
納米技術(shù)正在不斷滲透到現(xiàn)代科學(xué)技術(shù)的各個(gè)領(lǐng)域，形成了許許多多與納米技術(shù)相關(guān)的新興學(xué)科，如納米物理學(xué)、納米化學(xué)、納米電子學(xué)、納米材料學(xué)、納米生物學(xué)、納米機(jī)械學(xué)與納米量測(cè)學(xué)等。掃描隧道顯微鏡( stm )與原子力顯微鏡( afm )等是納米技術(shù)發(fā)展的重要基礎(chǔ)，也是納米科技工作者必不可少的研究工具，其中又以afm需求更大，應(yīng)用領(lǐng)域更為廣泛。

百科解釋

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.

詳細(xì)百科解釋

其他語(yǔ)種釋義

scanning probe microscopyとは意味：走査型｛そうさがた｝プローブ顕微鏡｛けんびきょう｝

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